Sobre este puesto de Lead DFT Engineer en NXP Semiconductors
NXP Semiconductors · Presencial · Noida
Summary : We are looking for an experienced and highly motivated DFT Lead Engineer with strong expertise in Design-for-Test methodologies for complex SoC/ASIC designs. The ideal candidate should have hands-on experience in Scan Insertion, ATPG, MBIST, LBIST, JTAG, Silicon Bring-up & Debug, and should be capable of driving complete DFT implementation and signoff activities from RTL to silicon validation.
The candidate will work closely with Design, Physical Design, Verification, and Post-Silicon teams to ensure high test coverage, manufacturability, and robust silicon quality.
Job Qualifications
- B.Tech / M.Tech in Electronics, Electrical, or related field
- 5–8 years of experience in core DFT
- Strong expertise in ATPG and LBIST methodologies
- Solid hands-on experience in scan insertion and compression
- Strong understanding and hands-on experience with iJTAG (IEEE 1687)
- Experience in MBIST architectures and repair flows
- Good understanding of Boundary Scan / JTAG and related standards (1149.1, 1500, 1687 preferred)
- Exposure to low-power DFT concepts
- Experience in testability analysis and silicon debug
- Strong problem-solving and debugging skills
- Ability to work in a cross-functional team environment
- Good communication and mentoring skills
Job Responsibilities
- Lead end-to-end DFT implementation for SoC subsystems
- Drive DFT RTL integration and verification activities
- Manage cross-functional coordination for DFT deliverables at block/subsystem level
- Implement full-scan DFT methodologies
- Develop and optimize scan insertion and compression techniques
- Execute ATPG flows to achieve required fault coverage
- Define and implement MBIST architectures, including repair flows
- Support LBIST planning and implementation
- Implement and ensure compliance with Boundary Scan / JTAG requirements
- Apply low-power DFT methodologies
- Perform testability analysis and improve design coverage
- Support silicon debug and failure analysis
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