Job's mission

What you will be working on

• Perform semiconductor metrology measurements, including thin-film thickness, optical characterization, particle inspection, and other materials characterization activities.
• Operate metrology tools for film thickness, critical dimension, surface, and defect characterization while meeting quality, cycle-time, and productivity requirements.
• Review measurement results, identify abnormalities or trends, and provide accurate and timely data to engineering teams.
• Support the development, optimization, and standardization of measurement methods to improve accuracy, repeatability, and efficiency.
• Work closely with process and engineering teams to support process development, monitoring, troubleshooting, and failure analysis activities.
• Prepare clear measurement reports and maintain accurate records of results and equipment status.
• Support equipment qualification, calibration, preventive maintenance, recipe setup, and measurement capability improvement activities.
• Maintain laboratory and cleanroom environments in accordance with safety and 6S standards.

What we are looking for

• Associate's or Bachelor's degree in Materials Science, Physics, Electrical Engineering, Chemical Engineering, or a related technical field.
• Basic understanding of semiconductor processes, materials characterization, metrology, or related engineering principles.
• Hands-on mindset with the ability and willingness to operate, maintain, and troubleshoot technical equipment.
• Strong attention to detail and commitment to measurement accuracy, data quality, and consistent execution.
• Analytical and problem-solving skills with the ability to identify and communicate measurement or equipment-related issues.
• Good communication and interpersonal skills with the ability to work effectively with engineering and cross-functional teams.
• Ability to organize multiple tasks and priorities in a fast-paced technical environment.

What sets you apart

• Previous hands-on experience with semiconductor metrology or materials characterization techniques such as ellipsometry, particle inspection, optical metrology, or critical dimension measurement.
• Experience with characterization equipment such as Atomic Force Microscopy (AFM), Nanoindentation, X-ray Photoelectron Spectroscopy (XPS), or Scanning Electron Microscopy (SEM).
• Experience supporting semiconductor process development, failure analysis, or materials characterization activities.
• Familiarity with statistical process control (SPC), gauge repeatability and reproducibility (GR&R), or measurement system analysis (MSA).
• Experience with equipment qualification, measurement recipe development, preventive maintenance, or metrology automation.
• Experience with data analysis tools or programming languages such as Python, MATLAB, JMP, or SQL.